English Books > Technical > Electronics - Circuits - General > Arithmetic Built-in Self-test for Embedded Systems

Arithmetic Built-in Self-test for Embedded Systems
Author: Rajski, Janusz; Author: Tyszer, Jerzy (Professor of Electral Engineering, McGill University, Montreal, Canada)
Hardback; Book; Appendices, Tables
256 pages
Published: November 1997
Pearson Professional Education
ISBN: 0137564384

The semi-conductor industry requires faster chips and more reliability, and new circuits are continually tested for this. Built-In Self-Testing is popular in doing this. This book looks at circuit design and covers concepts and techniques needed in the semiconductor industry.


PRODUCT CODE: 0137564384
USA/Canada:
US$ 136.20



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