Advanced Mathematical And Computational Tools In Metrology Iv; Editor: Ciarlini, P.; Editor: Pavese, F.; Hardback; Book

Editor: Ciarlini, P.; Editor: Pavese, F.
Series#:53; Series on Advances in Mathematics for Applied Sciences; Hardback; Book
336 pages
Published: January 2000
World Scientific Publishing Co Pte Ltd
ISBN: 9810242166
This item non-returnable. Order may not be canceled.

Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as better use of advanced mathematical tools and development of new ones. In this volume, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors, such as instrumentation and software, are likely to benefit from this exchange, since metrology has a high impact on the overall quality of industrial products, and applied mathematics is becoming more and more important in industrial processes.This book is of interest to people in universities, research centers and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and to those developing such mathemaIn this volume, scientists from both the mathematical and the metrological fields exchange their experiences. They address issues such as: evaluation of lateral shearing interferograms; fusing prior calibration information in metrology data analysis; and particle transport calculations.