English Books > Computer > General > 1992 Ieee International Workshop on Defect and Fault Tolerence in Vlsi Systems/92Th0481-2

1992 Ieee International Workshop on Defect and Fault Tolerence in Vlsi Systems/92Th0481-2
Hardback; Book
IEEE Computer Society Press
ISBN: 0818628359
This item non-returnable. Order may not be canceled.

Nearly three dozen papers from the November 1992 conference in Dallas, Texas, discuss methods of testing the large circuits used in microelectronics. The sections cover defect and yield modeling, fault tolerant arrays and systems, testing, concurrent error detection, system fault diagnosis, defect a



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