English Books > Computer > Operating Systems - General > 1996 IEEE International Test Conference

1996 IEEE International Test Conference
Author: Ieee Computer Society; Joint Author: Ieee Philadelphia Section
Paperback
1000 pages
Published: November 1997
IEEE Press
ISBN: 0780342097
This item non-returnable. Order may not be canceled.

The IEEE Test Conference is one of the largest premier technical conferences on the testing and total quality of integrated electronic circuits and the systems that are based on them. This text covers the 1996 conference.



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