English Books > Computer > Operating Systems - General > 2000 IEEE International Workshop on Defect Based Testing (DBT 2000)

2000 IEEE International Workshop on Defect Based Testing (DBT 2000)
Author: Ieee Computer Society
Paperback
85 pages
Published: May 2000
IEEE Press
ISBN: 0769506372
This item non-returnable. Order may not be canceled.

A study of defect based testing, containing papers from an IEEE workshop held in 2000. Areas addressed include: deep sub-micron IDDQ testing; defect oriented testing; current measurement and yield; and current and voltage test techniques.



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