English Books > Computer > Operating Systems - General > 18th IEEE VLSI Test Symposium (VTS 2000)

18th IEEE VLSI Test Symposium (VTS 2000)
Author: Ieee Computer Society
Paperback
500 pages
Published: May 2000
IEEE Press
ISBN: 0769506135
This item non-returnable. Order may not be canceled.

These papers constitute the proceedings of the IEEE VLSI Test Symposium 2000. Subjects covered include: microprocessor test/validation; low power BIST and scan; defect driven techniques; analogue test techniques; temperature and process drift issues; and more.



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