English Books > Computer > Operating Systems - General > 1999 International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 99)

1999 International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 99)
Author: Ieee Computer Society
Paperback
375 pages
Published: November 1999
IEEE Press
ISBN: 076950325X
This item non-returnable. Order may not be canceled.

These proceedings cover: yield; testing techniques; built-in self-test architectures; fault modelling and simulation; design for testing; self-checking processing units and systems; self-checking memories and interconnections; diagnosis; and reconfiguration.



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