English Books > Computer > Computer Architecture > 17th IEEE VLSI Test Symposium (VLSI '99)

17th IEEE VLSI Test Symposium (VLSI '99)
Author: Ieee Computer Society
Paperback
530 pages
Published: April 1999
IEEE Press
ISBN: 076950146X
This item non-returnable. Order may not be canceled.

The theme of the April 1999 symposium Scaling deeper to submicron: test technology challenges reflects the issues being created by the move toward nanometer technologies. Many creative and novel ideas and approaches to the current and future electronic circuit testing-related problems are explored



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